Re-designed and reengineered with new hardware and software, this is the ultimate quality inspection unit for wafer inspection systems (WIS) for wafer and cell production lines. Incorporating BT Imaging's proprietary PL Imaging technology, the module is rated up to 10,000 wph. This is the only inline PL imaging unit for raw silicon wafers that is backed by BT imaging’s extensive patent portfolio and market leading inspection algorithms. Typical use cases include wafer rejection, wafer quality sorting by predicted cell efficiency, wafer and cell R&D, and line process improvement. The iLS-W3 is also available in a carrier-loadable offline configuration with accompanying automation.

Backed by high powered machine learning and image processing algorithms, the iLS-C5 is BT Imaging's novel solution to solar production's most complex and efficiency-limiting issues. With PL and AOI imaging capabilities at high quality in a cost-effective and space-effective package, this tool is able to be tailored to assess and address previously uncontrolled high temperature process steps. Initial use cases have included TOPCon metallisation and firing effectiveness quantification and laser process quality tracking. BT Imaging continues to work with users of this tool to advance versatility and utility in any production line.

The iLS-M5 is a next generation tool for module producers and field installers alike. Able to perform on-the-fly module assessment, the iLS-M5 is a promoter of the standardisation of module quality from the beginning of the production line to installation and every step in between. With PL, EL and AOI capabilities, users can easily separate lifetime issues from series resistance defects associated with cell failure and degradation.