PL Imaging photoluminescence imaging BT imagingg

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Production Inspection

Modules & Software



The 'gold standard' tool for photovoltaics research labs

We have built a completely new and updated advanced laboratory tool for silicon bricks, ingots, wafers, cells and mini-modules. The result of many years of development and continuous improvements it is now being used by world leading researchers in institutions and wafer, cell and module manufacturers. Key applications include process improvement, R&D, process debug and root cause analysis, QA & QC, and accelerated install and FAT of production equipment. The LIS-R3 includes BT Imaging’s proprietary photoluminescence and series resistance imaging, electroluminescence imaging, biased photoluminescence imaging, QSS-PC injection level dependent lifetime, calibrated lifetime imaging, automated wafer and brick defect measurements based on our market leading image processing algorithms, Suns-Voc, dark and light IV measurements, plus a number of new analysis methods as part of the LIS-R Series Software Upgrade Package.


The all-purpose R&D tool for photovoltaics laboratory and QC applications

The LIS-R2-Plus benefits from substantial development work at BT Imaging leading to cost reductions on the LIS-R2 lab tool platform. We at BT Imaging are passing on these cost reductions to customers via the new LIS-R2-Plus platform. This new LIS-R2-Plus is the leading comprehensive luminescence laboratory inspection tool for silicon bricks, wafers and cells It is also ideally suited to be used at cell manufacturing lines for sampling, enabling fast ‘next-to-line’ process feedback and debugging. Backed by BT Imaging’s substantial patent portfolio.

LIS-R Series Software Upgrade Packages

Add new capability to your BT Imaging lab tool

A new range of advanced wafer and cell analysis packages available as options on the new LIS-R3 and as software upgrades to your existing BT Imaging LIS-R1, LIS-R2 laboratory tools. Includes (1) Cell IV package, (2) Advanced cell measurement package, (3) Cell Front and bulk separation package, (4) Multi-crystalline wafer algorithm package, (5) Mono-crystalline wafer analysis package, and (6) Thick mono wafer slug analysis package.

LIS-R Series Cell Stage Upgrade 

Support for 5BB and 6BB cell designs

This is our new Cell Stage for the LIS-R series tools which includes 5 or 6 Probe Rails as installed and is suitable for Solar Cells with 3,4,5 or 6 busbars. One or more Probe Rails can be removed if required to allow for measurement of 3 or 4 busbar cells.This new upgraded cell stage allows for improved quality of Rs and EL and the enablement of the new Advanced Cell Software Analysis Package.

Qa and iQ Systems

Offline Development Tools

Designed for offline process and product development purposes as well as for high-frequency quality control, the Qa and iQ systems can be fitted with the iLS-W3 and iLS-C3 inspection modules. These tools can be specified as stand alone tools with various load and unload options, or they can also be integrated with existing factory automation. In addition these systems can be configured with many of BT Imaging's advanced software packages, both for inline use and also packages for the post-processing of data in an off-line mode.


Wafer Inspection for Production

Completely re-designed and re-engineered with new hardware and software, this is the ultimate wafer electrical quality inspection unit for wafer inspection systems for wafer and cell production lines. Incorporating BT Imaging's proprietary PL Imaging technology the module is rated up to 5400 wph. This is the only inline photoluminescence imaging unit for raw silicon wafers that is backed by BT imaging’s extensive patent portfolio and market leading inspection algorithms. Typical use cases include wafer rejection, wafer quality sorting by predicted cell efficiency, wafer and cell R&D, and line process improvement and debug. 


Detection of solar cell defects in production

Our brand new non-stop scanning PL imaging inspection module for solar cells in production. A faster and non-contact replacement for EL Imaging.Finds all solar cells defects with automated image processing algorithms that can sort and reject cells in real time during production. Configured for easy integration with most cell test and sort machines.


Production Tool for Silicon Ingot and Brick Inspection

Designed in consultation with leading manufacturers of silicon bricks and ingots, BT Imaging's new silicon brick and ingot inspection production tool reports bulk lifetime and enables the production of silicon wafers that are ideal for high efficiency solar cells. This tool is for quality control and process development in silicon ingot and brick production facilities. Bricks and ingots are loaded manually or robotically. Throughput is designed to allow for 100% of product. For more details please contact BT Imaging.


PL Imaging Wafer Inspection System for Production

The photovoltaics industry’s premier silicon wafer inspection system for wafer and cell production. The QS-W3 can sort and reject all types of multicrystalline and monocrystalline wafers using state-of-the-art wafer inspection modules including BT Imaging's proprietary PL Imaging technology and optionally a range of other common inspection and measurement units. The QS-W3 comes with a wide range of automation options, operates at up to 5000 wph and can have up to 24 sorting bins and up to 8 inspection stations with coin stack, cassette, or integrated in-line loading, with a breakage rate of less than 0.1%. The QS-W3 comes complete with BT Imaging's wafer sorting and rejecting algorithms that use PL Imaging and other inspection information; these algorithms can be used to tailor wafer selection and sorting to specific cell line requirements.

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