Measurement Techniques
Summary
BTi’s luminescence tools allow a variety of imaging and non-imaging applications for the characterisation of silicon wafers and of fully processed silicon solar cells.
| IMAGING | NON IMAGING |
- Calibrated minority carrier lifetime (τeff) imaging
- Series resistance imaging
- Shunt localization
- Crack detection
- Diffusion length imaging
- Iron concentration imaging
- Qualitative luminescence imaging
- PL imaging on Si bricks
| - Light IV / dark IV
- Suns Voc
- QSS-PC, injection dependent effective minority carrier lifetime.
- QSS-PL, injection dependent effective minority carrier lifetime.
- Suns-PL
- Bulk doping
|
Select individual measurement techniques under Quick Links for more detailed information.
News
9/24/2008
BTi recently showcased its new LIS-R1 Solar Inspection Tool at the 23rd European Photovoltaic Solar Energy Conference and Exhibition in Valencia.
BTi received an overwhelming response from the solar community at the 23rd...
7/24/2008
BTi presentation at 18th Workshop on Crystalline Silicon Solar Cells and Modules
BT Imaging CTO, Thorsten Trupke presented a paper on "Photoluminescence characterization...
6/25/2008
David Jordan joins BTi Board
David brings a wealth of knowledge from the Solar Industry with more than 25 years experience managing research, development, and commercialisation of...